Z. Tong, S. Park and J. Rivas-Davila, “Empirical Circuit Model for Output Capacitance Losses in Silicon Carbide Power Devices,” 2019 IEEE Applied Power Electronics Conference and Exposition (APEC), 2019, pp. 998-1003, doi: 10.1109/APEC.2019.8721907.
Z. Tong, S. Park and J. Rivas-Davila, “Empirical Circuit Model for Output Capacitance Losses in Silicon Carbide Power Devices,” 2019 IEEE Applied Power Electronics Conference and Exposition (APEC), 2019, pp. 998-1003, doi: 10.1109/APEC.2019.8721907.